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Sieve Calibration - A New Simple But High Precision Approach

Sieve Calibration - A New Simple But High Precision Approach


This paper describes the preparation, measurement and use of microspheres for calibrating individual test sieves. Using a 63 micron sieve as an example, 2.5 million apertures, or 80% of the surface is examined in under 2 minutes. Because of the narrowness of the size distribution, a 5% difference in percent passing only results in a mean aperture difference of 1 micron, indeed, the measurement uncertainty for all 24 tests performed was only 0.7 microns. The calibration is independent of the method of shaking and can be used for most sieves.

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